Lasers for Raman and UV Raman spectroscopy

Diode lasers can be an effective choice for routine Raman measurements where moderate wavelength drift, broader linewidth, or higher noise levels are acceptable. They’re often used in entry-level benchtop instruments, educational setups, and portable analyzers that prioritize compactness and cost over spectral precision. For applications demanding long-term wavelength stability, sub-MHz linewidth, or low relative intensity noise—such as UV Raman, SERS, micro-Raman, or process monitoring—a single-frequency DPSS laser provides significantly better spectral performance and reproducibility. Equally critical is spectral and power stability: even small fluctuations can cause baseline drift or Raman-shift misalignment over long measurements. Skylark NX lasers combine high optical power with low noise (≤ 0.3 % RMS) and exceptional wavelength stability, ensuring consistent excitation and reproducible spectra in both research and production systems.

Yes. Skylark NX lasers are specifically designed for OEM and system integration. They feature a compact, thermally stable platform with straightforward electrical and mechanical interfaces. Long-term wavelength stability (±0.2 pm), low intensity drift (< 2 %), and factory pre-alignment reduce calibration requirements during instrument assembly. With up to 400 mW of single-frequency output at 320 nm, 349 nm, 780 nm, or 785 nm, NX lasers provide a robust, maintenance-free light source that simplifies system design and improves overall measurement repeatability.